Analysis of the charging kinetics in silver nanoparticles-silica nanocomposite dielectrics at different temperatures

Abstract Dielectric nanocomposite materials are now involved in a large panel of electrical engineering applications ranging from micro-/nano-electronics to power devices. The performances all these systems critically dependent on the evolution properties dielectric parts, especially under temperature increase. In this study we investigate impact single plane silver nanoparticles (AgNPs), embedded near surface thin silica (SiO 2 ) layer, electric field distribution, charge injection and dynamic processes for different AgNPs-based nanocomposites various temperatures range 25°C–110°C. charges injected locally by using an Atomic Force Microscopy (AFM) tip related potential profile is probed Kelvin Probe (KPFM). To get deeper understanding physical phenomena, distribution computed Finite Element Modeling (FEM). results show strong electrostatic coupling between AFM AgNPs, as well AgNPs when AgNPs-plane vicinity SiO -layer surface. At low (25°C) presence close surface, i.e., at distance 7 nm, limits amount charges. Besides, retain prevent lateral spreading after injection. When relatively high (110°C) increased compared temperatures. Moreover, speed nanocomposites. All findings imply that transport structures favored closely situated because them, additionally activated